Shenzhen Jinxi Boyuan Technology Co., Ltd.
Make every effort to build a new brand in China's instrument industry
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E4727B Advanced Low Frequency Noise Analyzer
Get a deeper and closer look at low frequency noise using A-LFNA integrated with WaferPro Express, featuring data analysis, wafer prober control, and test suite automation.
Highlights
The Advanced Low Frequency Noise Analyzer integrates with PathWave WaferPro (WaferPro Express) to enable turnkey noise measurements as well as measurements of DC characteristics, capacitance, and RF S-parameters
Measure extremely low device noise, such as transistor linear region noise, with the newly designed LNA
The state-of-the-art new LNA also allows noise measurements at very low bias currents
High power device noise measurements even at high currents like 1A
Fast measurements with multiple averaging for increased measurement efficiency even at high accuracy
This software module measures DC characteristics, 1/f noise, and random telegraph noise and performs data analysis
| Feature | Description / Capability |
|---|---|
| Software Integration | Seamless integration with PathWave WaferPro (WaferPro Express) software enables turnkey solutions for noise, DC characteristics, capacitance, and RF S-parameter measurements. |
| Measurement Sensitivity | Newly designed LNA enables extremely low device noise measurement, such as transistor linear region noise and measurements at very low bias currents. |
| High-Power Capability | Capable of high-power device noise measurement under high current conditions (e.g., up to 1A). |
| Measurement Speed | Fast measurement speed improves productivity, even under high-accuracy conditions requiring extensive averaging. |
| Software Analysis Module | Dedicated software module measures DC characteristics, 1/f noise, and random telegraph noise (RTN), and performs data analysis. |
| Probing Integration | Keysight's collaboration with FormFactor enables a complete, integrated on-wafer solution with autom |
